{"id":408,"date":"2019-01-31T16:19:23","date_gmt":"2019-01-31T20:19:23","guid":{"rendered":"https:\/\/www2.whoi.edu\/site\/nenimf\/?page_id=408"},"modified":"2021-06-09T08:21:04","modified_gmt":"2021-06-09T12:21:04","slug":"ims-3f","status":"publish","type":"page","link":"https:\/\/www2.whoi.edu\/site\/nenimf\/instrumentation-and-services\/ims-3f\/","title":{"rendered":"Instrumentation &#8211; IMS 3f"},"content":{"rendered":"\n\n\t<h1>Instrumentation &#8211; IMS 3f<\/h1>\n<p>The IMS 3f is a small radius magnetic sector ion microscope which can be operated as a microprobe providing elemental abundance and isotope analyses of a very small volume at the surface of solid sample.<\/p>\n\t<h3>SPECIFICATIONS<\/h3>\n<ul>\n<li>Duoplasmatron ion source for generation of O<sup>&#8211;<\/sup> ions;<\/li>\n<li>Mass resolution power (M\/\u0394M) up to 8,000;<\/li>\n<li>SEM secondary ion counting system includes ETP Electron Multipliers and ECL fast counting system from Pulse-Count Technology Inc. and Faraday cup;<\/li>\n<li>Microchannel plate \/ Fluorescent screen detector for use as a secondary ion microscope;<\/li>\n<li>CCD camera mounted for secondary ion imaging;<\/li>\n<li>Improved peripheral electronics for better voltage stability<\/li>\n<\/ul>\n\t\t\t\t<a href=\"https:\/\/www2.whoi.edu\/site\/nenimf\/wp-content\/uploads\/sites\/61\/2018\/07\/ims3f_diagram_73454_92613-1.jpg\" target=\"_self\" rel=\"noopener noreferrer\">\n\t\t\t\t<img loading=\"lazy\" src=\"https:\/\/www2.whoi.edu\/site\/nenimf\/wp-content\/uploads\/sites\/61\/2018\/07\/ims3f_diagram_73454_92613-1-300x271.jpg\" alt=\"diagram of the IMS 3f\" height=\"271\" width=\"300\" title=\"ims3f_diagram_73454_92613\" \/>\n\t\t\t\t<\/a>\n\t\tSchematic diagram of the IMS 3f\n\t\t\t\t<a href=\"https:\/\/www2.whoi.edu\/site\/nenimf\/wp-content\/uploads\/sites\/61\/2019\/05\/IMG_20190507_142658.jpg\" target=\"_self\" rel=\"noopener noreferrer\">\n\t\t\t\t<img loading=\"lazy\" src=\"https:\/\/www2.whoi.edu\/site\/nenimf\/wp-content\/uploads\/sites\/61\/2019\/05\/IMG_20190507_142658-300x225.jpg\" alt=\"WHOI 3f\" height=\"225\" width=\"300\" title=\"IMG_20190507_142658\" \/>\n\t\t\t\t<\/a>\n\t\tView of the Cameca IMS 3f at NENIMF\n\n","protected":false},"excerpt":{"rendered":"<p>Instrumentation &#8211; IMS 3f The IMS 3f is a small radius magnetic sector ion microscope which can be operated as a microprobe providing elemental abundance and isotope analyses of a very small volume at the surface of solid sample. SPECIFICATIONS Duoplasmatron ion source for generation of O&#8211; ions; Mass resolution power (M\/\u0394M) up to 8,000;&hellip;<\/p>\n","protected":false},"author":70,"featured_media":0,"parent":732,"menu_order":0,"comment_status":"closed","ping_status":"closed","template":"","meta":[],"_links":{"self":[{"href":"https:\/\/www2.whoi.edu\/site\/nenimf\/wp-json\/wp\/v2\/pages\/408"}],"collection":[{"href":"https:\/\/www2.whoi.edu\/site\/nenimf\/wp-json\/wp\/v2\/pages"}],"about":[{"href":"https:\/\/www2.whoi.edu\/site\/nenimf\/wp-json\/wp\/v2\/types\/page"}],"author":[{"embeddable":true,"href":"https:\/\/www2.whoi.edu\/site\/nenimf\/wp-json\/wp\/v2\/users\/70"}],"replies":[{"embeddable":true,"href":"https:\/\/www2.whoi.edu\/site\/nenimf\/wp-json\/wp\/v2\/comments?post=408"}],"version-history":[{"count":3,"href":"https:\/\/www2.whoi.edu\/site\/nenimf\/wp-json\/wp\/v2\/pages\/408\/revisions"}],"predecessor-version":[{"id":879,"href":"https:\/\/www2.whoi.edu\/site\/nenimf\/wp-json\/wp\/v2\/pages\/408\/revisions\/879"}],"up":[{"embeddable":true,"href":"https:\/\/www2.whoi.edu\/site\/nenimf\/wp-json\/wp\/v2\/pages\/732"}],"wp:attachment":[{"href":"https:\/\/www2.whoi.edu\/site\/nenimf\/wp-json\/wp\/v2\/media?parent=408"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}